SEM-EDX imaging
Imaging of the sample using a scanning electron microscope (SEM) with energy-dispersive X-ray spectroscopy (EDX or EDS).
Typically, several images are taken with varying magnifications to get a good overview of the sample. An EDX mapping, line scan, or point measurement is collected to measure the sample composition (elemental at.% or wt.%).
The sample can be prepared with a metallic coating for non-conductive samples.
For cross-section measurement, an additional preparation not included in the price might be needed: FIB, BIB or freeze fracturing.
- Suitable sample matrices
- Dry, solid material, powder, thin film or coating
- Required sample quantity
- 1x1 cm or 1 g
- Typical turnaround time
- 2 – 3 weeks after receiving the samples
- Detection limit
- 10 nm
- Available quality systems
- Measurlabs validated method
- Device types
- Method expert
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