SEM-EDX imaging

Imaging of the sample using a scanning electron microscope (SEM) with energy-dispersive X-ray spectroscopy (EDX or EDS).

Typically, several images are taken with varying magnifications to get a good overview of the sample. An EDX mapping, line scan, or point measurement is collected to measure the sample composition (elemental at.% or wt.%).

The sample can be prepared with a metallic coating for non-conductive samples.

For cross-section measurement, an additional preparation not included in the price might be needed: FIB, BIB or freeze fracturing.

Suitable sample matrices
Dry, solid material, powder, thin film or coating
Required sample quantity
1x1 cm or 1 g
Typical turnaround time
2 – 3 weeks after receiving the samples
Detection limit
10 nm
Available quality systems
Measurlabs validated method
Device types

Pricing and online order

Price per sample (Excl. VAT):
510 €

We also charge a 97 € service fee per order.

Large batches of samples are eligible for discounts.

Samples are entered during checkout.

Our experts review all orders to ensure the testing method is suitable for your needs and samples.

Questions? We're happy to help.

Questions? We're happy to help.

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Answering the following questions helps us prepare an offer for you faster:

  • How many samples do you have and what is the sample material?
  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

Have questions or need help? Email us at or call our sales team.