Ellipsometry measurement
Ellipsometry is an optical technique that characterizes polarized light reflected from a sample's surface.
It can measure the thickness or the refractive index of a layer.
Do not hesitate to contact the method expert for more details.
More information about the method:
Ellipsometry- Suitable sample matrices
- Thin films, semiconductors, dielectrics, polymers, organic coatings, metallic layers
- Typical turnaround time
- 2 weeks after receiving the samples
- Available quality systems
- Measurlabs validated method
- Device types
- Method expert
Semiconductors
Surface testingPrice
Starting from (Excl. VAT):
340 €per sample
We also charge a 97 € service fee per order.
Large batches of samples are eligible for discounts.
Questions? We're happy to help.
Questions? We're happy to help.
Ask for an offer
Fill in the form, and we'll reply in one business day.
Have questions or need help? Email us at info@measurlabs.com or call our sales team.