VPD-ICP-MS noble metal analysis, 150 mm wafer

Chemical analysisChemical analysis
Elemental analysisElemental analysis
Material testingMaterial testing
Surface testingSurface testing

Determination of trace metal contamination on silicon wafer surfaces. using VPD-ICP-MS. Noble metal analysis includes quantifying of following elements: Ru, Pd, Ag, Pt, and Au. Price is for 150 mm wafers.

Suitable sample matrices
Bare-silicon wafers
Typical turnaround time
3 weeks after receiving the samples
Quality system
Accredited testing laboratory
Method expert


First sample


per sample

Additional samples


per sample

Prices excluding VAT.

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1.Order one of our testing services or ask for help.
Delivery package
2.Send us your samples.
Laboratory technician conducting measurements
3.We measure your materials or products.
Report inside an envelope
4.You receive the test report and the results in your email.

Ask for a quote

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You can also email us at info@measurlabs.com or call us at +358 40 735 4843.

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