VPD-ICP-MS LIKE standard metal analysis, 100 mm samples

Determination of trace metal contamination on ALD thin film surfaces. using VPD-ICP-MS LIKE method. Standard metal analysis includes quantifying of following elements: Li, B, Na, Mg, Al, P, K, Ca, Ti, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ge, As, Y, Mo, Sn, Ba, Ce, Hf, Ta, W, and Pb. Price is for 100 mm wafers.

Suitable sample matrices
Thin films, ALD samples
Typical turnaround time
3 weeks after receiving the samples
Quality system
Accredited testing laboratory
Method expert
Kia Bertula
Kia Bertula
Price (VAT 0)
First sample: 776 €
Additional samples: 642 € per sample

Interested in this measurement?

You can order this measurement via online checkout. Just fill in a few details below:

776 €(VAT 0)

Questions? We're happy to help.

Questions? We're happy to help.

ringing phone

Ordering made easy

Person on a computer
1.Order one of our testing services or ask for help.
Delivery package
2.Send us your samples.
Laboratory technician conducting measurements
3.We measure your materials or products.
Report inside an envelope
4.You receive the test report and the results in your email.