Cross-sectional high resolution TEM-EDX imaging + FIB preparation

Cross-sectional high-resolution TEM-EDX with focused ion beam (FIB) preparation is a powerful combination of sample preparation and imaging techniques.

  • A cross-section of the sample is prepared with a focused ion beam (FIB)

  • The sample is imaged with a high-resolution transmission electron microscope (HR-TEM)

  • The elemental composition of the sample is determined using electron dispersive X-ray spectroscopy (EDX).

Suitable sample matrices
Solid materials, thin film, silicon wafers, glass substrates, metals, etc.
Typical turnaround time
3 weeks after receiving the samples
Detection limit
Sub-nm
Available quality systems
Measurlabs validated method
Device types

Order this test online

First sample (Excl. VAT):
1,900 €
Additional samples (Excl. VAT):
1,780 €per sample
If you have a large number of samples, contact us for a possible discount.

Samples are entered during checkout.

Our experts review all orders to ensure the testing method is suitable for your needs and samples.

Large number of samples or specialized needs?

Questions? We're happy to help.

Questions? We're happy to help.

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  • How many samples do you have and what is the sample material?
  • Do you have a recurring need for these tests? If yes, how often and for how many samples at a time?

Have questions or need help? Email us at or call +358 50 336 6128.