Cross-sectional HR-TEM imaging + EDX + FIB

Cross-sectional imaging of a sample with a high-resolution transmission electron microscope (HR-TEM) and determination of the elemental composition of the sample using electron dispersive X-ray spectroscopy (EDX). The cross-sectional sample is prepared using focused ion beam (FIB).

Suitable sample matrices
Many hard materials, such as thin film coated silicon wafers, glass substrates, metals and many more.
Minimum sample amount
Even small particles can be prepared as cross-sectional samples and imaged with TEM.
Typical turnaround time
4 weeks after receiving the samples
Detection limit
Resolution goes down to sub-nanometer range.
Quality system
Measurlabs validated method
Device families
Method expert
Kia Bertula
Kia Bertula

Interested in this measurement?

You can order this measurement via online checkout. Just fill in a few details below:

2,304 €
First sample: 2,304 €
Additional samples: 2,004 € per sample

Questions? We're happy to help.

Questions? We're happy to help.

Ordering made easy

Person on a computer
1.Order one of our testing services or ask for help.
Delivery package
2.Send us your samples.
Laboratory technician conducting measurements
3.We measure your materials or products.
Report inside an envelope
4.You receive the test report and the results in your email.