Cross-sectional HR-TEM imaging + EDX + FIB

Cross-sectional HR-TEM with EDX and FIB is a powerful combination of sample preparation and imaging techniques. The analysis consists of three phases: 1) A cross-sectional sample is prepared with a focused ion beam (FIB) 2) The sample is imaged with a high-resolution transmission electron microscope (HR-TEM) 3) The elemental composition of the sample is determined using electron dispersive X-ray spectroscopy (EDX).

Suitable sample matrices
Many hard materials, such as thin film coated silicon wafers, glass substrates, metals, and many more.
Minimum sample amount
Even small particles can be prepared as cross-sectional samples and imaged with TEM.
Typical turnaround time
4 weeks after receiving the samples
Detection limit
Resolution goes down to sub-nanometer range.
Quality system
Measurlabs validated method
Device families
Method expert
Kia Bertula
Kia Bertula

Order this test online

First sample (VAT 0):
2,718 €
Additional samples (VAT 0):
2,598 €per sample
If you have a large number of samples, contact us for a possible discount.

Samples are entered during checkout.

Our experts review all orders to ensure the testing method is suitable for your needs and samples.

Questions? We're happy to help.

Questions? We're happy to help.

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