Secondary ion mass spectrometry (SIMS)
Material testing
Surface testingSecondary Ion Mass Spectrometry (SIMS) is a quantitative method to determine the concentration depth profiles of the elements. SIMS can be used for a wide variety of solid-state sample types. Investigations close to the surface set a typical range of 5 nm to 20 µm and a lateral range from 50 µm up to 500 µm. -Often SIMS can determine all elements in the mass range from hydrogen to uran.
- Suitable sample matrices
- Solid
- Typical turnaround time
- 4 weeks after receiving the samples
- Quality system
- Measurlabs validated method
- Device families
- Method expert
Questions? We're happy to help.
Questions? We're happy to help.
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2.Send us your samples.
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