Cross-sectional HR-TEM imaging with FIB sample preparation

Electron microscopyElectron microscopy
MicroscopyMicroscopy
Surface testingSurface testing

Cross-sectional imaging of a sample with a high-resolution transmission electron microscope (HR-TEM). Samples are prepared with focused ion beam (FIB).

Suitable sample matrices
Many hard materials, such as thin film coated silicon wafers, glass substrates, metals and many more.
Minimum sample amount
Even small particles can be prepared as cross-sectional samples and imaged with TEM.
Typical turnaround time
2 weeks after receiving the samples
Detection limit
Resolution down to sub-nanometer range.
Quality system
Measurlabs validated method
Device families
TEM
Method expert

Price

First sample

1689

per sample

Additional samples

1989

per sample

Prices excluding VAT.

Ordering made easy

Person on a computer
1.Order one of our testing services or ask for help.
Delivery package
2.Send us your samples.
Laboratory technician conducting measurements
3.We measure your materials or products.
Report inside an envelope
4.You receive the test report and the results in your email.

Ask for a quote

You can also email us at info@measurlabs.com or call us at +358 40 735 4843.

We always reply within one business day.