Cross-sectional HR-TEM imaging with FIB sample preparation
This analysis is a combination of sample preparation with FIB and imaging with high-resolution TEM. A cross-section sample is first prepared with a focused ion beam (FIB), after which the sample is imaged with a high-resolution transmission electron microscope (HR-TEM). The resulting image resolution is very high, even below one nanometer.
More information about the method family:
TEM Analysis (TEM)Cross-Sectional TEM AnalysisFocused Ion Beam (FIB)
Chemicals
Metals and mining
Pharmaceuticals
Polymers and plastics
Semiconductors
Microscopy
Surface testing- Suitable sample matrices
- Many hard materials, such as thin film coated silicon wafers, glass substrates, metals and many more.
- Minimum sample amount
- Even small particles can be prepared as cross-sectional samples and imaged with TEM.
- Typical turnaround time
- 4 weeks after receiving the samples
- Detection limit
- Resolution down to the sub-nanometer range.
- Quality system
- Measurlabs validated method
- Device types
- Method expert
Questions? We're happy to help.
Questions? We're happy to help.
Results in four easy steps
1
Select the tests you need
2
Get an order confirmation
3
Ship your samples to us
4
Receive your test report