Cross-sectional HR-TEM imaging with FIB sample preparation

This analysis is a combination of sample preparation with FIB and imaging with high-resolution TEM. A cross-section sample is first prepared with a focused ion beam (FIB), after which the sample is imaged with a high-resolution transmission electron microscope (HR-TEM). The resulting image resolution is very high, even below one nanometer.

Suitable sample matrices
Many hard materials, such as thin film coated silicon wafers, glass substrates, metals and many more.
Minimum sample amount
Even small particles can be prepared as cross-sectional samples and imaged with TEM.
Typical turnaround time
4 weeks after receiving the samples
Detection limit
Resolution down to the sub-nanometer range.
Quality system
Measurlabs validated method
Device types
Method expert
Kia Bertula
Kia Bertula

Order this test online

First sample (VAT 0):
2,360 €
Additional samples (VAT 0):
2,043 €per sample
If you have a large number of samples, contact us for a possible discount.

Samples are entered during checkout.

Our experts review all orders to ensure the testing method is suitable for your needs and samples.

Questions? We're happy to help.

Questions? We're happy to help.

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