Cross-sectional HR-TEM imaging with FIB sample preparation

This analysis is a combination of sample preparation with FIB and imaging with high-resolution TEM. A cross-section sample is first prepared with a focused ion beam (FIB), after which the sample is imaged with a high-resolution transmission electron microscope (HR-TEM). The resulting image resolution is very high, even below one nanometer.

Suitable sample matrices
Many hard materials, such as thin film coated silicon wafers, glass substrates, metals and many more.
Minimum sample amount
Even small particles can be prepared as cross-sectional samples and imaged with TEM.
Typical turnaround time
4 weeks after receiving the samples
Detection limit
Resolution down to the sub-nanometer range.
Quality system
Measurlabs validated method
Device families
Method expert
Kia Bertula
Kia Bertula

Order this measurement online

First sample: 2,360 €
Additional samples: 2,043 € per sample
Payment by invoice

Samples are entered during checkout

Questions? We're happy to help.

Questions? We're happy to help.

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